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Product Introduction： This device is mainly used to simulate sunlight and collect the volt ampere characteristic curves of crystalline silicon photovoltaic cell modules, single section perovskite cell modules, and stacked perovskite cell modules. The device uses a xenon lamp steady-state light source, and the light source level meets the IEC60904-9 ed3 A+AA+level. It can measure conventional polycrystalline, single crystal Perc, Topcon, BC, heterojunction CIGS、GaAs、CdTe、 I-V curve, P-V curve, irradiance line, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, fill factor, conversion efficiency, series resistance, parallel resistance, etc. of single junction perovskite, stacked perovskite and other battery components.
Key Parameters
Irradiance non-uniformity is ≤1%, class A+
Irradiance instability is ≤1%, class A+
240*240mm
300*300mm
320*320mm
is compatible with the transient test as well
the shortest scanning in step of ≤0.2s
Temperature Chamber can be integratedto achieve measurement of temperaturecoefficient
EL testing system can achieve IV andEL testing at a same production section
Integrated with IR infrared thermal imager to realize heat spot testing
