Product Introduction: This device is mainly used to simulate sunlight and collect the volt ampere characteristic curves of crystalline silicon photovoltaic cell modules, single section perovskite cell modules, and stacked perovskite cell modules. The device uses LED combination steady-state light sources, each of which can be adjusted separately. The light source level meets the IEC60904-9 ed3 A+A+A+level and can measure conventional polycrystalline, monocrystalline Perc, Topcon, BC, heterojunction, etc CIGS、GaAs、CdTe、 I-V curve, P-V curve, irradiance line, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, fill factor, conversion efficiency, series resistance, parallel resistance, etc. of single junction perovskite, stacked perovskite and other battery components.
Key Parameters
300-350nm and 1100-1200nmcan be
customized
Irradiance non-uniformity is ≤1%, class A+
Irradiance instability is ≤1%, class A+
Other size can be customized
customized
(constant voltage) and other test
technologies, all these technologies canbeswitched by software. It also equippedpoint-by-point scanning ( meet the shortest scanning in step of ≤0.2s
Temperature Chamber can be integratedto achieve measurement of temperaturecoefficient