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Automatic IV Tester, EL and Sorter
Product Introduction： This device is mainly used to simulate sunlight and collect the volt ampere characteristic curve of crystalline silicon photovoltaic cells. The device adopts a long arc pulse xenon lamp transient light source, and the light source level meets the IEC60904-9 ed3 A+A+A+level. It can measure the I-V curve, P-V curve, irradiance line, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, fill factor, conversion efficiency, series resistance, parallel resistance, etc. of conventional polycrystalline, monocrystalline Perc, Topcon, BC, heterojunction and other high-capacity cells.
Key Parameters
Standard
IEC60904-9:2020
Light type
Xenon lamp
Light source lifetime
2000000
Spectrum wavelength
300-1200nm
Classification of light source
Spectral match is 0.875-1.125, class A+
Irradiance non-uniformity is ≤1%, class A+
Irradiance instability is ≤1%, class A+
Irradiance non-uniformity is ≤1%, class A+
Irradiance instability is ≤1%, class A+
Irradiance intensity
200W/㎡~1200W/㎡
Illumination area
240*240mmn
Other size can be customized
Other size can be customized
Repeatability
＜0.03%
Pulse duration
10-100ms，in step of 1ms
Testing technology
With four quadrant load, it equipped linear scanning, advanced magnetic hysteresis, successive approximation testing (SAT) , intelligent testing method (IAT) , and dark fieldtesting
Measurable Cell type
Poly-crystalline, Mono-crystalline, TopCon, BC, HJT and other high capacitance cells.
Capacity
≥2200pcs/h，higher speed can be customized
Postioning
Optical positioning
Material loading
2 Bins
Material unloading
4 Bins, taking by Bernoulli vacuumsucker
Optional service
Rear side light is designed for measurement of bifacial solar cells
EL testing system can achieve IV andELtesting at a same production section
AOI testing system, to realize automaticsorting of color
Integrated with IR infrared thermal imagerto realize heat spot testing
Double channel testing technology, toachieve simultaneous testing of two half-cut cells
EL testing system can achieve IV andELtesting at a same production section
AOI testing system, to realize automaticsorting of color
Integrated with IR infrared thermal imagerto realize heat spot testing
Double channel testing technology, toachieve simultaneous testing of two half-cut cells
